Beamline performance
| Energy range (keV) |
filter*) thickness |
CM stripe |
mirror angle (mrad) |
DCM crystals |
FM toroid |
beam size at sample, FWHM**), hor × vert |
flux at sample (ph/sec) at 100mA |
|---|---|---|---|---|---|---|---|
| 2.4-7 | - | Si | 4.7 | Si(111) | Rh | 206×56 µm2 | 1·1013 @7 keV |
| 6-15 | 57 µm | Rh | 4.7 | Si(111) | Rh | 208×53 µm2 | 1·1013 @9 keV |
| 7-20 | 0.7 mm | Rh | 3.3 | Si(311) | Rh | 8×0.4 mm2 | 1·1012 @18 keV |
| 14-20 | 0.7 mm | Pt | 2.4 | Si(311) | Pt | 225×56 µm2 | 1·1012 @18 keV |
| 18-35 | 1.5 mm | 5·1011 @30 keV | |||||
| 30-70 | 3.0 mm | Pt | 1.2 | Si(311) Si(333) |
Pt | 8×0.4 mm2 | 1.4·1010 @50 keV |
*) CVD-diamond
**) without fabrication- and thermal induced figure errors;
with the errors the vertical size is expected to be smaller than 300 µm at E<35 keV.
