Materials Characterization Techniques for XRD and XRF
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Conference
The aim of this scientific-technical workshop is an up-to-date overview of the principal in-house X-ray diffraction and X-ray fluorescence techniques for materials characterization. Part of the workshop will be also devoted to the technical description of the new equipment of RIGAKU.
| What |
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| When |
May 19, 2014 from 09:00 am to 02:00 pm |
| Where | Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Campus de la UAB, Cerdanyola del Vallès |
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